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  1. Nondestructive evaluation of semiconductor materials and devices
    [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tusculano, Italy, September 19 - 29, 1978]
    Published: 1979
    Publisher:  Plenum Press, New York [u.a.]

    Location:
    Universitätsbibliothek Erlangen-Nürnberg, Technisch-naturwissenschaftliche Zweigbibliothek
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    Technische Universität München, Universitätsbibliothek
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    Universität der Bundeswehr München, Universitätsbibliothek
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    Universitätsbibliothek Regensburg
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    Source: Union catalogues
    Language: English
    Media type: Book
    ISBN: 0306402939
    RVK Categories: UP 2800 ; UP 3100
    Series: NATO advanced study institutes series : Series B, Physics ; 46
    Subjects: Semiconducteurs - Essais - Congrès; Semiconductors; Rückstreuung; Akustische Messtechnik; Konferenz; Optische Messtechnik; Charakterisierung; Halbleiterwerkstoff; Zerstörungsfreie Werkstoffprüfung; Zuverlässigkeit; Halbleiter; Halbleiterbauelement; Werkstoffprüfung; Röntgenographie
    Scope: XI, 782 S., Ill., graph. Darst.
  2. Nondestructive Evaluation of Semiconductor Materials and Devices
    Author: Zemel, Jay N.
    Published: 1979
    Publisher:  Springer US, Boston, MA

    Location:
    Technische Universität München, Universitätsbibliothek
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    Content information
    Source: Union catalogues
    Language: English
    Media type: Ebook
    Format: Online
    ISBN: 9781475713527; 9781475713541
    Other identifier:
    Series: NATO Advanced Study Institutes Series, Series B: Physics ; 46
    Subjects: Engineering; Computer engineering; Electrical Engineering; Ingenieurwissenschaften; Werkstoffprüfung; Charakterisierung; Halbleiter; Halbleiterbauelement; Röntgenographie; Konferenz; Akustische Messtechnik; Optische Messtechnik; Zerstörungsfreie Werkstoffprüfung; Halbleiterwerkstoff; Rückstreuung; Zuverlässigkeit
    Scope: 1 Online-Ressource (XI, 782 p)
    Notes:

    From September 19-29, a NATO Advanced Study Institute on Non­ destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele­ rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub­ stantial immediate concern to the device technologies and end users
  3. Nondestructive evaluation of semiconductor materials and devices
    lectures pres. at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, Sept. 19-29, 1978
    Contributor: Zemel, Jay N (Herausgeber)
    Published: 1979
    Publisher:  Plenum Press, New York, NY

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    Universitätsbibliothek der RWTH Aachen
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    Universitäts- und Landesbibliothek Bonn
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    Universitäts- und Landesbibliothek Düsseldorf
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    Universitätsbibliothek Duisburg-Essen
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    Universitätsbibliothek der Fernuniversität
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    Universitätsbibliothek der RPTU in Kaiserslautern
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    Universitätsbibliothek Siegen
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    Source: Union catalogues
    Contributor: Zemel, Jay N (Herausgeber)
    Language: English
    Media type: Book
    Format: Print
    ISBN: 0306402939
    RVK Categories: UP 3100 ; UP 2800
    Series: NATO advanced study institutes series : Series B, Physics ; 46
    Subjects: Halbleiter; Halbleiterwerkstoff; Werkstoffprüfung; Halbleiter; Charakterisierung
    Scope: 782 S.
  4. Nondestructive evaluation of semiconductor materials and devices
    LECTURES PRESENTED AT THE NATO ADVANCED STUDY INSTITUTE ON NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES, HELD AT THE VILLA TUSCOLANO, SEPTEMBER 19-29, 1978
    Published: 1979
    Publisher:  Plenum Press, NEW YORK, LONDON

    Location:
    Ruhr-Universität Bochum, Universitätsbibliothek
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    Source: Union catalogues
    Media type: Book
    Format: Print
    ISBN: 0306402939
    RVK Categories: UP 3100 ; UP 2800
    Series: NATO ADVANCED STUDY INSTITUTES SERIES : SER. B, PHYSICS ; VOL. 46
    Subjects: Halbleiter; Halbleiterwerkstoff; Werkstoffprüfung; Halbleiter; Charakterisierung
    Scope: XI, 782 S. : ZAHLR. ILL. U. GRAPH. DARST.
  5. Characterization of materials
    Publisher:  VCH, Weinheim u.a.

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    Source: Union catalogues
    Language: Undetermined
    Media type: Book
    ISBN: 3527268138; 1560811900
    RVK Categories: UQ 8000 ; ZM 2550 ; ZM 3000
    Series: Materials science and technology ; ...
    Subjects: Werkstoffprüfung; Charakterisierung; Werkstoffkunde; Werkstoff; Stoffeigenschaft; Methode; Festkörper
  6. Die metallischen Werkstoffe des Maschinenbaues
    Author: Bickel, Erich
    Published: 1958
    Publisher:  Springer, Berlin [u.a.]

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    Technische Hochschule Augsburg
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    Deutsches Museum, Bibliothek
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    Technische Universität München, Universitätsbibliothek
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    Universität der Bundeswehr München, Universitätsbibliothek
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    OTH- Ostbayerische Technische Hochschule Regensburg, Hochschulbibliothek
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    Hochschule für angewandte Wissenschaften Würzburg-Schweinfurt, Abteilungsbibliothek Schweinfurt
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    Source: Union catalogues
    Language: German
    Media type: Book
    RVK Categories: ZM 4000
    Edition: 2., neubearb. Aufl.
    Subjects: Metallography; Metals; Metallischer Werkstoff; Werkstoff; Metall; Metallkunde; Werkstoffprüfung; Maschinenbau
    Scope: XII, 439 S., Ill., graph. Darst.
  7. Nondestructive evaluation of semiconductor materials and devices
    lectures pres. at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tuscolano, Italy, Sept. 19-29, 1978
    Contributor: Zemel, Jay N. (Hrsg.)
    Published: 1979
    Publisher:  Plenum Press, New York, NY

    Location:
    Universitätsbibliothek der RWTH Aachen
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    CH2187-46+1
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    Physik-Bibliothek
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    110:Bpe 315
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    Universität Bonn, Physikalisches Institut, Fachbereichs-Bibliothek Physik
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    CONF 34
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    Universitäts- und Landesbibliothek Düsseldorf
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    phyu600.z53
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    Universitätsbibliothek Duisburg-Essen
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    XWQ1152_d
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    Universitätsbibliothek der Fernuniversität
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    XWZ/ZEM
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    Universitätsbibliothek der RPTU in Kaiserslautern
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    PHY 607/807
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    Universitätsbibliothek Siegen
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    Source: Union catalogues
    Contributor: Zemel, Jay N. (Hrsg.)
    Language: English
    Media type: Book
    ISBN: 0306402939
    RVK Categories: UP 2800 ; UP 3100
    Series: NATO advanced study institutes series : Series B, Physics ; 46
    Subjects: Halbleiterwerkstoff; Halbleiter; Charakterisierung; Werkstoffprüfung
    Scope: 782 S.
  8. Nondestructive evaluation of semiconductor materials and devices
    LECTURES PRESENTED AT THE NATO ADVANCED STUDY INSTITUTE ON NONDESTRUCTIVE EVALUATION OF SEMICONDUCTOR MATERIALS AND DEVICES, HELD AT THE VILLA TUSCOLANO, SEPTEMBER 19-29, 1978
    Published: 1979
    Publisher:  Plenum Press, NEW YORK, LONDON

    Location:
    Ruhr-Universität Bochum, Universitätsbibliothek
    Signature:
    WQB11975
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    Loan of volumes, no copies
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    Source: Union catalogues
    Language: Undetermined
    Media type: Book
    ISBN: 0306402939
    RVK Categories: UP 2800 ; UP 3100
    Series: NATO ADVANCED STUDY INSTITUTES SERIES : SER. B, PHYSICS ; VOL. 46
    Subjects: Halbleiterwerkstoff; Charakterisierung; Werkstoffprüfung; Halbleiter
    Scope: XI, 782 S., ZAHLR. ILL. U. GRAPH. DARST.
  9. Nondestructive Evaluation of Semiconductor Materials and Devices
    Author: Zemel, Jay N.
    Published: 1979
    Publisher:  Springer US, Boston, MA

    Location:
    TU Berlin, Universitätsbibliothek
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    Content information
    Source: Union catalogues
    Language: English
    Media type: Ebook
    Format: Online
    ISBN: 9781475713527; 9781475713541
    Other identifier:
    Series: NATO Advanced Study Institutes Series, Series B: Physics ; 46
    Subjects: Engineering; Computer engineering; Electrical Engineering; Ingenieurwissenschaften; Werkstoffprüfung; Charakterisierung; Halbleiter; Halbleiterbauelement; Röntgenographie; Konferenz; Akustische Messtechnik; Optische Messtechnik; Zerstörungsfreie Werkstoffprüfung; Halbleiterwerkstoff; Rückstreuung; Zuverlässigkeit
    Scope: 1 Online-Ressource (XI, 782 p)
    Notes:

    From September 19-29, a NATO Advanced Study Institute on Non­ destructive Evaluation of Semiconductor Materials and Devices was held at the Villa Tuscolano in Frascati, Italy. A total of 80 attendees and lecturers participated in the program which covered many of the important topics in this field. The subject matter was divided to emphasize the following different types of problems: electrical measurements; acoustic measurements; scanning techniques; optical methods; backscatter methods; x-ray observations; accele­ rated life tests. It would be difficult to give a full discussion of such an Institute without going through the major points of each speaker. Clearly this is the proper task of the eventual readers of these Proceedings. Instead, it would be preferable to stress some general issues. What came through very clearly is that the measurements of the basic scientists in materials and device phenomena are of sub­ stantial immediate concern to the device technologies and end users
  10. Materials science and technology
    a comprehensive treatment – 2a/2b, Characterization of materials
    Published: 2005
    Publisher:  VCH, Weinheim [u.a.]

    Location:
    Humboldt-Universität zu Berlin, Universitätsbibliothek, Jacob-und-Wilhelm-Grimm-Zentrum
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    Source: Union catalogues
    Language: English
    Media type: Book
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    RVK Categories: UP 3600 ; UQ 8000 ; VE 9670 ; ZM 3000
    Edition: Softcover ed.
    Subjects: Charakterisierung; Werkstoff; Werkstoffprüfung; Festkörper; Analyse
    Scope: 706, 705 S., Ill., graph. Darst.
  11. Nondestructive evaluation of semiconductor materials and devices
    [lectures presented at the NATO advanced study institute, held at the Villa Tuscolano, Italy, Sept. 19-20, 1978]
    Contributor: Zemel, Jay N. (Publisher)
    Published: 1978
    Publisher:  Plenum Press, New York [u.a.]

    Location:
    Humboldt-Universität zu Berlin, Universitätsbibliothek, Jacob-und-Wilhelm-Grimm-Zentrum
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    Source: Union catalogues
    Contributor: Zemel, Jay N. (Publisher)
    Language: Undetermined
    Media type: Book
    ISBN: 0306402939
    RVK Categories: UP 2800 ; UP 3100
    Series: NATO advanced study institutes series: Series B, Physics ; 46
    Subjects: Zerstörungsfreie Werkstoffprüfung; Optische Messtechnik; Halbleiter; Konferenz; Halbleiterwerkstoff; Zuverlässigkeit; Halbleiterbauelement; Charakterisierung; Akustische Messtechnik; Rückstreuung; Röntgenographie; Werkstoffprüfung
    Scope: XI, 782 S., Ill.
  12. Nondestructive evaluation of semiconductor materials and devices
    [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tusculano, Italy, September 19 - 29, 1978]
    Published: 1979
    Publisher:  Plenum Press, New York [u.a.]

    Location:
    Freie Universität Berlin, Universitätsbibliothek
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    Staatsbibliothek zu Berlin - Preußischer Kulturbesitz, Haus Unter den Linden
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    TU Berlin, Universitätsbibliothek
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    Content information
    Source: Philologische Bibliothek, FU Berlin; Staatsbibliothek zu Berlin
    Language: English
    Media type: Book
    ISBN: 0306402939
    RVK Categories: UP 2800 ; UP 3100
    Series: NATO advanced study institutes series : Series B, Physics ; 46
    Subjects: Semiconducteurs - Essais - Congrès; Semiconductors; Rückstreuung; Akustische Messtechnik; Konferenz; Optische Messtechnik; Charakterisierung; Halbleiterwerkstoff; Zerstörungsfreie Werkstoffprüfung; Zuverlässigkeit; Halbleiter; Halbleiterbauelement; Werkstoffprüfung; Röntgenographie
    Scope: XI, 782 S., Ill., graph. Darst.
  13. Die metallischen Werkstoffe des Maschinenbaues
    Author: Bickel, Erich
    Published: 1958
    Publisher:  Springer, Berlin [u.a.]

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    Staatsbibliothek zu Berlin - Preußischer Kulturbesitz, Haus Unter den Linden
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    Stiftung Deutsches Technikmuseum Berlin, Bibliothek
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    TU Berlin, Universitätsbibliothek
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    Verbund der Öffentlichen Bibliotheken Berlins - VÖBB
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    Source: Staatsbibliothek zu Berlin
    Language: German
    Media type: Book
    RVK Categories: ZM 4000
    Edition: 2., neubearb. Aufl.
    Subjects: Metallography; Metals; Metallischer Werkstoff; Werkstoff; Metall; Metallkunde; Werkstoffprüfung; Maschinenbau
    Scope: XII, 439 S., Ill., graph. Darst.
  14. Characterization of materials
    Contributor: Lifshin, Eric (Hrsg.)
    Publisher:  VCH, Weinheim [u.a.]

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    früher: Ruhr-Universität Bochum, Institut für Geologie, Mineralogie und Geophysik, Bibliothek
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    Source: Union catalogues
    Contributor: Lifshin, Eric (Hrsg.)
    Language: English
    Media type: Book
    RVK Categories: UQ 8000 ; ZM 2550 ; ZM 3000
    Series: Materials science and technology ; ...
    Subjects: Werkstoffkunde; Festkörper; Stoffeigenschaft; Werkstoff; Werkstoffprüfung; Methode; Charakterisierung
  15. Beiträge zur analytischen Charakterisierung hochreiner keramischer Werkstoffe
    Author: Graule, Thomas
    Published: 1988

    Location:
    Universitätsbibliothek Clausthal
    Signature:
    Da 79116
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    Technische Universität Bergakademie Freiberg, Bibliothek 'Georgius Agricola'
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    90.339 8.
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    Technische Universität Hamburg, Universitätsbibliothek
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    2110-9579
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    Karlsruher Institut für Technologie, KIT-Bibliothek
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    89 DA 4460
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    Saarländische Universitäts- und Landesbibliothek
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    H 80-4767
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    Max-Planck-Institute Stuttgart, Bibliothek
    Signature:
    Diss.1988
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    Universitätsbibliothek Stuttgart
    Signature:
    Diss. 1989/4443
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    Universitätsbibliothek der Eberhard Karls Universität
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    US 89.4413
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    UB Weimar
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    110 932
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    Source: Union catalogues
    Language: German
    Media type: Dissertation
    Format: Print
    Subjects: Werkstoff; Reinststoff; ; Keramischer Werkstoff; Charakterisierung; ; Keramik; Werkstoffprüfung; Chemische Analyse;
    Scope: 177 S, Ill., graph. Darst, 21 cm
    Notes:

    Dortmund, Univ., Diss., 1988
  16. Characterization of materials
    Contributor: Lifshin, Eric (Herausgeber)
    Publisher:  VCH, Weinheim [u.a.]

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    Source: Union catalogues
    Contributor: Lifshin, Eric (Herausgeber)
    Language: English
    Media type: Book
    Format: Print
    RVK Categories: UQ 8000 ; ZM 2550 ; ZM 3000
    Series: Materials science and technology ; ...
    Subjects: Stoffeigenschaft; Festkörper; Stoffeigenschaft; Werkstoffprüfung; Werkstoff; Charakterisierung; Werkstoffkunde; Werkstoffprüfung; Methode